检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
机构地区:[1]College of Electronics & Information Engineering,Tongji University
出 处:《Journal of Donghua University(English Edition)》2014年第2期98-101,共4页东华大学学报(英文版)
基 金:National Natural Science Foundation of China(No.61034004)
摘 要:The prediction problem of the actual value of the dynamic parameters in the simulation model in semiconductor manufacturing was discussed. Considering the fact that the default value of processing time of one certain equipment in the simulation model was not the same as its actual value,a general data driven prediction model of the processing time was built based on support vector regression( SVR),with the utilization of manufacturing information in manufacturing execution system( MES). The processing time of one certain equipment was highly related to the status of the equipment itself and the wafers being processed. To uncover the relationship of the processing time with the information of historical products,process flow,technical standard of silicon wafers and manual intervention,data were extracted from MES and used to build a prediction model. This model was employed on an ion implantation equipment as a case, and the effectiveness of the proposed method was shown by comparing with other approaches.The prediction problem of the actual value of the dynamic parameters in the simulation model in semiconductor manufacturing was discussed. Considering the fact that the default value of processing time of one certain equipment in the simulation model was not the same as its actual value. a general data driven prediction model of the processing time was built based on support vector regression (SVR) , with the utilization of manufacturing information in manufacturing execution system (MES). The processing time of one certain equipment was highly related to the status of the equipment itself and the wafers being processed. To uncover the relationship of the processing time with the information of historical products. process flow. technical standard of silicon wafers and manual intervention. data were extracted from MES and used to build a prediction model. This model was employed on an ion implantation equipment as a case. and the effectiveness of the proposed method was shown by comparing with other approaches.
关 键 词:SEMICONDUCTOR MANUFACTURING SUPPORT VECTOR regression(SVR) PROCESSING time prediction
分 类 号:TP274[自动化与计算机技术—检测技术与自动化装置]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.249