IC测试仪的数据采集及GUI的设计与实现  

Design and implementation of data acquisition card and GUI based on IC tester

作　　者：韩磊[1] 马宁[1] 

机构地区：[1]电子科技大学微电子与固体电子学院,四川成都610054

出　　处：《电子设计工程》2014年第13期91-93,共3页Electronic Design Engineering

摘　　要：为了快速精确测量模拟芯片总谐波失真,转换速率等参数指标,设计了一款基于模拟IC测试仪的数据采集系统,模拟信号经过数据采集卡后变成数字信号,根据数字信号进行相关参数的测量,然后将结果通过控制板经过PCI传给上位机,将结果显示在GUI中的Datalog中,硬件方面,测量精度为14位,最低采样频率为10MHz,误差精度小于2%,软件方面,采用多种方式设计AB-MS测试界面的显示,确保界面使用的多样性和便捷。通过实际测试芯片表明系统的设计指标符合项目的要求。Data acquisition card is used to measure important parameters of analog chip automatically such as Total Harmonic Distortion and Slew Rate. Designed a data acquisition system based on analog IC tester Data acquisition card can convert analog signal to digital signal and according to the digital signal we can calculate parameters ,the results send to principal computer through PCI Bus and show in Datalog of the GUI. Hardware index, measuring accuracy for 14, the minimum sampling frequency for 10 MHZ, error precision is less than 2%.Software index： measure multiple Site at the same time and include manual and automatic test. According to test chip actually, the system design indexes meet the requirements.

关 键 词：模拟IC测试机 DIG AB-MS界面 数据采集 DATALOG 图形用户界面 

分 类 号：TN06[电子电信—物理电子学]