一种用于合成试验中预测短路电流零点的方法  

Method for Forecasting Current Zero Point in Synthetic Short Circuit Test

作　　者：李鹏[1] 高飞[1] 刘朴[1] 刘平[1] 何健 

机构地区：[1]西安高压电器研究院有限责任公司,西安710077 [2]西安秦骊成套电器有限公司,西安710075

出　　处：《高压电器》2014年第7期57-62,共6页High Voltage Apparatus

摘　　要：笔者针对大容量开关电器试验用Weil合成试验回路,给出了一种基于递推形式的电流零点预测方法,并且分析了这种电流零点预测方法的误差来源和误差消除的方法。为了验证该方法的准确性,笔者研制了一个应用于合成试验回路的DSP测控系统,并对过零点预测算法进行了实验验证。实验测试表明,文中所提的电流零点预测方法是准确的,相关测控系统的软硬件实现方式是可行的,具有实际应用价值。In this paper,a kind of current zero-cross point prediction method based on recursion algorithm is proposed for Weil synthetic test circuit which is used for the test on high voltage and high power switchgear. The error source and error elimination methods are analyzed. In order to verify the accuracy of the method,a measurement and control system based on DSP and used for the synthetic test circuit is developed. The actual test results show that the proposed method, as well as the developed hardware and software are feasible and valuable for application.

关 键 词：高压断路器 合成试验 预测 电流零点 

分 类 号：TM561[电气工程—电器]