纳米金属薄膜中光子自旋霍尔效应的最佳弱测量  

Optimal Weak Measurements of Photonic Spin Hall Effect in Nanometal Film

作　　者：李星[1] 周新星[1] 罗海陆[1] 

机构地区：[1]湖南大学物理与微电子科学学院微纳光电器件及应用教育部重点实验室,湖南长沙410082

出　　处：《光学学报》2014年第7期308-313,共6页Acta Optica Sinica

基　　金：国家自然科学基金(11274106);湖南省自然科学基金(12JJ7005);湖南省研究生科研创新项目(CX2013B130)

摘　　要：光子自旋霍尔效应是一种潜在的精密测量工具,在探测微结构材料结构参数变化的研究中具有重要的物理意义。基于光子自旋霍尔效应的弱测量模型研究了纳米金属薄膜中的光子自旋霍尔效应,研究结果表明当弱测量中放大角取相应的特殊值时(即最佳弱测量点),纳米金属薄膜中光子自旋霍尔效应的放大后横移值可达到最大,大大提高了光子自旋霍尔效应的探测精度;在最佳弱测量点得到的放大后横移可以更精确地推断出金属薄膜的实际厚度。实验结果与理论分析符合较好,该方法为研制基于光子自旋霍尔效应的精密测量工具提供了理论与实验基础。Photonic spin Hall effect （SHE） is a potential precision measurement tool, which has important physical significance in the study of detecting the change of microstructure material＇s structure parameters. The photonic SHE in nanometal films is studied using the weak measurement model. The results show that when the amplification angle takes the special value （the optimal weak measurement point） in the weak measurement, the amplified transverse shift of the photonic SHE in nanometal films can reach the maximum, which greatly improves the detection precision of the photonic SHE. In addition, the amplified shift obtained in the optimal weak measurement point can be used to determine the actual thickness of the nanometal film with higher accuracy. The experimental results coincide well with the theoretical analysis. This method provides theoretical and experimental basis for the future development of precision measuring tools.

关 键 词：量子光学 光子自旋霍尔效应 结构参数 弱测量 纳米金属薄膜 

分 类 号：O436[机械工程—光学工程]