Simulation of temporal characteristics of ion-velocity susceptibility to single event upset effect  

作　　者：耿超 习凯 刘天奇 古松 刘杰 

机构地区：[1]Institute of Modern Physiscs, Chinese Academy of Sciences [2]University of Chinese Academy of Sciences

出　　处：《Chinese Physics B》2014年第8期415-419,共5页中国物理B（英文版）

基　　金：Project supported by the National Natural Science Foundation of China(Grant Nos.11179003,10975164,10805062,and 11005134)

摘　　要：Using a Monte Carlo simulation tool of the multi-functional package for SEEs Analysis （MUFPSA）, we study the temporal characteristics of ion-velocity susceptibility to the single event upset （SEU） effect, including the deposited energy, traversed time within the device, and profile of the current pulse. The results show that the averaged dposited energy decreases with the increase of the ion-velocity, and incident ions of 2~9Bi have a wider distribution of energy deposition than 132Xe at the same ion-velocity. Additionally, the traversed time presents an obvious decreasing trend with the increase of ion-velocity. Concurrently, ion-velocity certainly has an influence on the current pulse and then it presents a particular regularity. The detailed discussion is conducted to estimate the relevant linear energy transfer （LET） of incident ions and the SEU cross section of the testing device from experiment and simulation and to critically consider the metric of LET.Using a Monte Carlo simulation tool of the multi-functional package for SEEs Analysis （MUFPSA）, we study the temporal characteristics of ion-velocity susceptibility to the single event upset （SEU） effect, including the deposited energy, traversed time within the device, and profile of the current pulse. The results show that the averaged dposited energy decreases with the increase of the ion-velocity, and incident ions of 2~9Bi have a wider distribution of energy deposition than 132Xe at the same ion-velocity. Additionally, the traversed time presents an obvious decreasing trend with the increase of ion-velocity. Concurrently, ion-velocity certainly has an influence on the current pulse and then it presents a particular regularity. The detailed discussion is conducted to estimate the relevant linear energy transfer （LET） of incident ions and the SEU cross section of the testing device from experiment and simulation and to critically consider the metric of LET.

关 键 词：ion-velocity single event upset deposited energy traversed time 

分 类 号：O562[理学—原子与分子物理]