Thickness-dependent Orientation Structure in Poly(ethylene oxide) Multi-layer Crystals  

作　　者：Yi-ning He Xiao Liu Qi Liao 周建军 Hong Huo Lin Li 

机构地区：[1]Beijing Key Laboratory of Energy Transition and Storage Materials, College of Chemistry, Beijing Normal University [2]Institute of Chemistry, Chinese Academy of Sciences

出　　处：《Chinese Journal of Polymer Science》2014年第9期1253-1259,共7页高分子科学（英文版）

基　　金：financially supported by the Natural Science Foundation of China(Nos.20634050,20804053 and 21074015);the Science Foundation of Beijing(No.212030);the National Basic Research Program of China(973 Project No.2011CB605605);the Fundamental Research Funds for the Central Universities

摘　　要：Poly（ethylene oxide） multi-layer crystals were obtained and the re-crystallization behavior was studied to give insight into how melt thickness and temperature affect the lamellar orientation. For a special re-crystallization temperature, there exists a critical transition thickness range for the occurrence of edge-on lamellar orientation. Below the critical thickness, only flat-on lamellae were observed. While above the critical thickness, both flat-on and edge-on lamellae were found and the proportion of the edge-on lamellae increases with thickness. At low re-crystallization temperatures （below 30 ℃）, the critical transition thickness gradually increases from about 15 nm to 35 nm when the re-crystallization temperature was increased from 20 ℃ to 30 ℃. However, when the re-crystallization temperature is above 30 ℃, the critical transition thickness becomes constant. Our results demonstrated that the lamellar orientation could be specially modified by changing the melt thickness and re-crystallization temperature.Poly（ethylene oxide） multi-layer crystals were obtained and the re-crystallization behavior was studied to give insight into how melt thickness and temperature affect the lamellar orientation. For a special re-crystallization temperature, there exists a critical transition thickness range for the occurrence of edge-on lamellar orientation. Below the critical thickness, only flat-on lamellae were observed. While above the critical thickness, both flat-on and edge-on lamellae were found and the proportion of the edge-on lamellae increases with thickness. At low re-crystallization temperatures （below 30 ℃）, the critical transition thickness gradually increases from about 15 nm to 35 nm when the re-crystallization temperature was increased from 20 ℃ to 30 ℃. However, when the re-crystallization temperature is above 30 ℃, the critical transition thickness becomes constant. Our results demonstrated that the lamellar orientation could be specially modified by changing the melt thickness and re-crystallization temperature.

关 键 词：PEO multi-layer crystal Lamellar orientation Re-crystallization temperature. 

分 类 号：O631.13[理学—高分子化学]