不同厚度像素CdZnTe探测器的性能测试和评估  

Experiment and simulation of performance characteristics for pixellated CdZnTe detectors with various thickness

作　　者：沈敏[1,2] 肖沙里[1] 张流强[1] 曹玉琳[3] 陈宇晓[3] 

机构地区：[1]重庆大学光电技术及系统教育部重点实验室,重庆400030 [2]重庆工商职业学院,重庆合川401520 [3]中国工程物理研究院电子工程研究所,四川绵阳621900

出　　处：《强激光与粒子束》2014年第3期204-209,共6页High Power Laser and Particle Beams

基　　金：国家自然科学基金项目(10876044/A06)

摘　　要：碲锌镉材料(CdZnTe)是目前探测X射线和γ射线的最好材料之一。将241 Am和137 Cs辐射源作用于像素CdZnTe探测器,通过实验和仿真分别得到能量谱估计、能量分辨率和峰值效率。由实验和仿真结果得出:在662keV的高能量下,厚度较大的CdZnTe探测器可获得更高的能量分辨率和峰值效率,但在59.5keV低能处会出现拖尾升高和电荷损失的现象;厚度较薄的探测器在低能处的特性反而更好。Cadmium zinc telluride(CZT)is one of the preferred materials for the fabrication of X-ray and gamma-ray detector.The purpose of this work was to evaluate limitations of pixellated CdZnTe detector's thickness used under different photon energy and find the best possible compromise for different detector thicknesses.Simulations and experimental investigations of the energy spectrum,energy resolution and photopeak efficiency measured by pixellated CdZnTe detectors have been performed using 241 Am and 137 Cs irradiation sources.It is concluded that thick CdZnTe provides high energy resolution and photopeak efficiency for high energy of 662keV,but it suffers from increased tailing and charge loss for low energy of 59.5keV;while thin devices can provide better performance.

关 键 词：碲锌镉 探测器 能量谱 能量分辨率 峰值效率 

分 类 号：TL817[核科学技术—核技术及应用]