TD-LTE终端射频一致性测试系统EVM测量算法研究  

Research of EVM Measurement in TD-LTE Terminal RF Conformance Test

作　　者：李鹏飞[1] 冯琳琳[1] 

机构地区：[1]重庆邮电大学通信网与测试技术重点实验室,重庆400065

出　　处：《现代电信科技》2014年第4期15-18,共4页Modern Science & Technology of Telecommunications

基　　金：国家科技重大专项资助项目(项目编号:2012ZX03001021-0 04)

摘　　要：TD-LTE终端射频一致性测试是检验TD-LTE终端射频部分是否符合协议标准的重要手段。该文针对测试系统中难以实现EVM(误差矢量幅度)测量的问题,阐述了EVM的基本概念,分析了EVM的测量目的及需求,设计了一种适用于射频测试系统的EVM的测量方法。系统测试验证表明,该算法可用于测量UE端EVM,且结果准确可靠。TD-LTE terminal RF conformance test is animportant means to detect whether the TD-LTE terminal RF module meets the protocol standards. In thispaper, the basic concept of EVM was explained, theobjective and requirement of EVM measurement wereanalyzed, and the EVM algorithm measurement suitable for RF test system was designed to solve theEVM measurement issues which is difficult to realizein test system. The results of system test shows thatthis algorithm can be used to measure EVM of thesystem UE, and demonstrates convincingly that the results is accurate and reliable.

关 键 词：TD-LTE EVM 射频-致性测试 

分 类 号：TN915.04[电子电信—通信与信息系统]