口腔全景X射线摄影机检定实践  

Practical exploration of verification for panorama roentgenogram of oral cavity

作　　者：高铮亚[1] 王鹏德[1] 眭国平[1] 陆逊[1] 肖瑶[1] 

机构地区：[1]上海市计量测试技术研究院

出　　处：《上海计量测试》2014年第2期22-24,共3页Shanghai Measurement and Testing

摘　　要：针对口腔全景X射线摄影机的特点,特别是用半导体探测器检定时遇到的问题,通过实验,研究其主要参数的测量,为解决口腔全景X射线摄影机相关参数的量值溯源提供可参考的数据依据。There are limitations and shortcomings in the verification process for panorama roentgenogram of oral cavity especially when the semiconductor detector are used. In this paper, in order to solve the quantity traceability problem of relative values, experiments are designed to study the measurement of main parameters of panorama roentgenogram of oral cavity considering to its characteristics and provide reference data for its relative parameters.

关 键 词：探测器 口腔全景X射线摄影机 量值溯源 

分 类 号：TH787[机械工程—仪器科学与技术]