一种基于迭代PTM模型的电路可靠性评估方法  

A Method of Circuit Reliability Estimation Based on Iterative PTM Model

作　　者：肖杰[1,2] 江建慧[2] 朱旭光[2] 

机构地区：[1]浙江工业大学计算机科学与技术学院,杭州310023 [2]同济大学软件学院,上海201804

出　　处：《计算机学报》2014年第7期1508-1520,共13页Chinese Journal of Computers

基　　金：国家自然科学基金(60903033);国家"九七三"重点基础研究发展规划项目基金(2005CB321604)资助~~

摘　　要：纳米工艺的快速发展既给电路设计创造了新的机会,同时也带来了新的挑战,基于纳米器件的电路可靠性设计便是主要挑战之一,因此有必要研究在设计的早期阶段便能准确地评估电路可靠性的方法.考虑到经典的概率转移矩阵方法在电路可靠性计算中的优势与不足,文中提出了宏门的概念和以宏门为单位的迭代概率转移矩阵模型,并设计了相应的电路可靠性评估算法,可计算从原始输入到任意引线位置的电路可靠度,该算法的复杂性与宏门的数目成线性关系.理论分析与在74系列电路和ISCAS85基准电路上的实验结果证明了文中所提方法的准确性、有效性及潜在的应用价值.The rapid development of nanotechnology has not only opened up new possibilities, but also brought new challenges for circuit design. One of the main challenges is the reliability of circuit design by using nano-devices. Therefore, it is necessary to develop an accurate and fast methodology for circuit reliability estimation at early design stage. Considering the advantages and disadvantages of the classical methods of circuit reliability calculation based on probabilistic transfer matrix （PTM）, this paper proposed the concept of macro-gates together with an iterative PTM model based on macro-gates, and a novel algorithm for calculating the circuit reliability from primary input to any pin position in a circuit. The complexity of the proposed algorithm is linearly related to the number of macro-gates in a circuit. Simulation results for 74-series and ISCAS85 benchmark circuits demonstrate the accuracy, efficiency, and potential application value of the proposed algorithm.

关 键 词：门级电路可靠性评估 宏门 逻辑划分 概率方法 迭代概率转移矩阵模型 

分 类 号：TP331[自动化与计算机技术—计算机系统结构]