X-荧光光谱仪压片法测定无碱玻璃化学成分的研究  

Determination of E-glass Composition by X-ray Fluorescence Spectrometer Using Wafers

作　　者：陈建良 柴云峰 仰丽琴 陆佳锋 

机构地区：[1]巨石集团有限公司,桐乡314500

出　　处：《玻璃纤维》2014年第4期14-19,共6页Fiber Glass

摘　　要：阐述了无碱玻璃加入粘结剂经混合研磨后,将试样压片成型在X-荧光光谱仪上测定Si、B、Al、Ca、Mg、K、Na、Fe、Ti、F十个化学成分;对试验条件中研磨时间及稀释比的选择进行了讨论,通过对X-荧光光谱仪压片法测定无碱玻璃化学成分的精密度、准确度试验,发现该方法在玻璃纤维池窑作业生产控制中可行。A mixture of E-glass and binder was grinded uniformly and pressed to form wafers to determine the chemical composition of glass, including silica, alumina, boron oxide, calcium oxide, magnesium oxide, potassium oxide, sodium oxide, iron oxide, titanium dioxide and fluoride. The tests on the precision and accuracy of this method proved that the this method was applicable to the control of glass fiber production by direct-meh process.

关 键 词：X-荧光光谱仪 压片法 无碱玻璃 化学成分 

分 类 号：TQ171.771.2[化学工程—玻璃工业]