STATIC REGIME IMAGING OF LOCATIONS OF CERTAIN 3D ELECTROMAGNETIC IMPERFECTIONS FROM A BOUNDARY PERTURBATION FORMULA  

作　　者：Seraphin M. Mefire 

机构地区：[1]IECL, CNRS UMR 7502, Universite de Lorraine, Faculte des Sciences et Technologies de Nancy, 54506 Vandoeuvre-les-Nancy Cedex, France

出　　处：《Journal of Computational Mathematics》2014年第4期412-441,共30页计算数学（英文）

摘　　要：We are concerned, in a static regime, with a three-dimensional bounded domain of certain an imaging approach of the locations in electromagnetic imperfections. This approach is related to Electrical Impedance Tomography and makes use of a new perturbation formula in the electric fields. We present two localization procedures, from a Current Pro- jection method that deals with the single imperfection context and an inverse Fourier process that is devoted to multiple imperfections configurations. These procedures extend those that were described in our previous work, since operating for a broader class of settings. Namely, the localization is additionally performed for certain purely electric imperfections, as established from numerical simulations.We are concerned, in a static regime, with a three-dimensional bounded domain of certain an imaging approach of the locations in electromagnetic imperfections. This approach is related to Electrical Impedance Tomography and makes use of a new perturbation formula in the electric fields. We present two localization procedures, from a Current Pro- jection method that deals with the single imperfection context and an inverse Fourier process that is devoted to multiple imperfections configurations. These procedures extend those that were described in our previous work, since operating for a broader class of settings. Namely, the localization is additionally performed for certain purely electric imperfections, as established from numerical simulations.

关 键 词：Inverse problems Maxwell equations Electric fields INHOMOGENEITIES Elec-trical lmpedanee Tomography Current Projection method FFT Numerical boundarymeasurements Random noise Edge elements Least square systems Incomplete ModifiedGram-Schmidt preconditioning. 

分 类 号：TP223[自动化与计算机技术—检测技术与自动化装置] TU473.16[自动化与计算机技术—控制科学与工程]