Research on Secondary Electron Emission Yield Intellectualized Testing System of Space Materials Based on Kingview and PLC  

作　　者：CHANG Tianhai YIN Peipei 

机构地区：[1]School of Electronic and Information Engineering, South China University of Technology

出　　处：《Chinese Journal of Electronics》2014年第3期635-638,共4页电子学报（英文版）

基　　金：supported by the National Natural Science Foundation of China(No.51047002)

摘　　要：This paper describes an intellectualized testing system of the secondary electron emission yield of space materials by combining the technology of electronic control and communication. This system is based on Kingview 6.52 and PLC. The system achieves the document multithreading intellectualized control of vacuum obtaining, pulse modulation of electron gun and on-off of all power sources. The application of Kingvlew 6.52 makes the design of system more convenient and improves the control quality. The communication with PLC through serial interface improves the ability of data collection and real-tlme disposing of industry personal computers.This paper describes an intellectualized testing system of the secondary electron emission yield of space materials by combining the technology of electronic control and communication. This system is based on Kingview 6.52 and PLC. The system achieves the document multithreading intellectualized control of vacuum obtaining, pulse modulation of electron gun and on-off of all power sources. The application of Kingview 6.52 makes the design of system more convenient and improves the control quality. The communication with PLC through serial interface improves the ability of data collection and real-time disposing of industry personal computers.

关 键 词：Secondary electron emission Space materials  Programmable logic controller（PLC）  Kingview 

分 类 号：O462.2[理学—电子物理学]