高浓度料浆中纳米氧化铈颗粒粒度分布的测量  

Measurement of Particle Size Distribution of Nano-ceria in Concentrated Slurry

作　　者：魏齐龙[1] 李晓媛[1] 王超[1] 何建国[1] 

机构地区：[1]中国工程物理研究院机械制造工艺研究所,四川绵阳621900

出　　处：《稀土》2014年第4期1-5,共5页Chinese Rare Earths

基　　金：国家重大科技专项(2013ZX04006011);国家自然科学基金项目(51202228)

摘　　要：提出了采用聚电解质原溶液稀释高浓度料浆,再进行粒度分布测量的方法,并基于扩展DLVO理论和动态光散射测量粒度分布的基本原理进行了分析。研究表明,浓度高达20%(质量分数)以上的纳米氧化铈料浆采用原溶液稀释至5%(质量分数)以下料浆后,可间接地获得其中纳米颗粒的粒度分布,且其结果与直接制备的相近浓度料浆的测量结果、透射电镜直接测量结果吻合良好。原溶液稀释技术,对纳米颗粒间的双电层相互作用力和颗粒分散状态扰动小,可有效提高纳米颗粒粒度分布测量的浓度上限,对研究高浓度料浆中纳米颗粒的粒度分布和聚集-分散状态具有重要意义。Particle size distribution of nano-ceria in concentrated slurries was measured through diluting the slurries with original polyelectrolyte solutions, and analysis was conducted based on the extended DLVO theory and the basic measurement principle of dynamic light scattering （DLS）. It is found that when the slurry with concentration about 20.4 wt% is diluted to concentration below 5 wt% , the PSD of the nano - ceria can be measured indirectly, which accords well with both that of a slurry prepared directly with near concentration and that from TEM images. Dilution technology with original solution, which hardly disturbs the electro double layer （EDL） interaction between nano -particles and their agglomeration -dispersion state, can improve the concentration upper limit of measuring PSD of nano - particles, and has significance for researching PSD and agglomeration - dispersion state of nano - particles in concentrated slurries.

关 键 词：纳米氧化铈 高浓度料浆 粒度分布 动态光散射 原溶液稀释 

分 类 号：TQ133.3[化学工程—无机化工] O648.22[理学—物理化学]