Multi-energy four-channel Kirkpatrick–Baez microscope for X-ray imaging diagnostics at the Shenguang-II laser facility  

作　　者：伊圣振 穆宝忠 王新 蒋励 朱京涛 王占山 贺鹏飞 方智恒 王伟 傅思祖 

机构地区：[1]MOE Key Laboratory of Advanced Micro-Structured Materials [2]School of Physics Sciences and Engineering, Tongji University [3]School of Aerospace Engineering and Applied Mechanics, Tongji University [4]Shanghai Institute of Laser Plasma,CAEP

出　　处：《Chinese Optics Letters》2014年第9期105-109,共5页中国光学快报（英文版）

基　　金：supported by the National Natural Science Foundation of China(Nos.11305116 and 11105098);the National Key Technology Support Program of China(No.2013BAK14B02);the National"973"Program of China(No.2011CB922203)

摘　　要：A four-channel Kirkpatrick Baez microscope working at multiple energy bands is developed for multiframe X-ray imaging diagnostics at the Shenguang-II laser facility. The response to the multiple energy bands is realized by coating the double-periodic multilayers on the reflected surfaces of the microscope. Because of the limited size of the microstrips in the X-ray framing camera, the image separation is controlled by the coni- cal angle of the reference cores during microscope assembly. This study describes the optical and multilayer design, assembly, and aligmnent of the developed microscope. The microscope achieves a spatial resolution of 4 5 gin in the laboratory and 10 20 ~tm at Shenguang-II laser facility within a 300 tim field of view. The versatile nature of the developed microscope enables the multiple microscopes currently installed in the laser facility to be replaced with a single, multipurpose microscope.A four-channel Kirkpatrick Baez microscope working at multiple energy bands is developed for multiframe X-ray imaging diagnostics at the Shenguang-II laser facility. The response to the multiple energy bands is realized by coating the double-periodic multilayers on the reflected surfaces of the microscope. Because of the limited size of the microstrips in the X-ray framing camera, the image separation is controlled by the coni- cal angle of the reference cores during microscope assembly. This study describes the optical and multilayer design, assembly, and aligmnent of the developed microscope. The microscope achieves a spatial resolution of 4 5 gin in the laboratory and 10 20 ~tm at Shenguang-II laser facility within a 300 tim field of view. The versatile nature of the developed microscope enables the multiple microscopes currently installed in the laser facility to be replaced with a single, multipurpose microscope.

关 键 词：Band structure Laser diagnostics MULTILAYERS Optical multilayers X ray analysis 

分 类 号：TH742[机械工程—光学工程]