Stacking stability of MoS_2 bilayer: An ab initio study  被引量:1

Stacking stability of MoS_2 bilayer: An ab initio study

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作  者:陶鹏 郭怀红 杨腾 张志东 

机构地区:[1]Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences

出  处:《Chinese Physics B》2014年第10期411-416,共6页中国物理B(英文版)

基  金:Project supported by the National Natural Science Foundation of China(Grant Nos.11004201 and 50831006);the National Basic Research Program of China(Grant No.2012CB933103);the IMR SYNL-Young Merit Scholars;T.S.Ke Research Grant for support

摘  要:The study of the stacking stability of bilayer MoS2 is essential since a bilayer has exhibited advantages over single layer MoS2 in many aspects for nanoelectronic applications. We explored the relative stability, optimal sliding path between different stacking orders of bilayer MoS2, and (especially) the effect of inter-layer stress, by combining first-principles density functional total energy calculations and the climbing-image nudge-elastic-band (CI-NEB) method. Among five typical stacking orders, which can be categorized into two kinds (I: AA', AB and II: AA', AB', A'B), we found that stacking orders with Mo and S superposing from both layers, such as AA' and AB, is more stable than the others. With smaller computational efforts than potential energy profile searching, we can study the effect of inter-layer stress on the stacking stability. Under isobaric condition, the sliding barrier increases by a few eV/(uc.GPa) from AA' to ABt, compared to 0.1 eV/(uc.GPa) from AB to [AB]. Moreover, we found that interlayer compressive stress can help enhance the transport properties of AA'. This study can help understand why inter-layer stress by dielectric gating materials can be an effective means to improving MoS2 on nanoelectronic applications.The study of the stacking stability of bilayer MoS2 is essential since a bilayer has exhibited advantages over single layer MoS2 in many aspects for nanoelectronic applications. We explored the relative stability, optimal sliding path between different stacking orders of bilayer MoS2, and (especially) the effect of inter-layer stress, by combining first-principles density functional total energy calculations and the climbing-image nudge-elastic-band (CI-NEB) method. Among five typical stacking orders, which can be categorized into two kinds (I: AA', AB and II: AA', AB', A'B), we found that stacking orders with Mo and S superposing from both layers, such as AA' and AB, is more stable than the others. With smaller computational efforts than potential energy profile searching, we can study the effect of inter-layer stress on the stacking stability. Under isobaric condition, the sliding barrier increases by a few eV/(uc.GPa) from AA' to ABt, compared to 0.1 eV/(uc.GPa) from AB to [AB]. Moreover, we found that interlayer compressive stress can help enhance the transport properties of AA'. This study can help understand why inter-layer stress by dielectric gating materials can be an effective means to improving MoS2 on nanoelectronic applications.

关 键 词:MOS2 stacking order climbing-image nudge-elastic band isobaric sliding 

分 类 号:O469[理学—凝聚态物理]

 

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