从单幅干涉图中恢复相位的区间反转方法  

Retrieving phase from single interferogram by interval inversion method

作　　者：曾文雯[1,2,3] 钟小品[4] 李景镇[1,2] 

机构地区：[1]深圳大学电子科学与技术学院,广东深圳518060 [2]深圳大学深圳微纳光子信息技术重点实验室,广东深圳518060 [3]深圳大学光电工程学院,广东深圳518060 [4]深圳大学机电与控制工程学院,广东深圳518060

出　　处：《红外与激光工程》2014年第9期3151-3156,共6页Infrared and Laser Engineering

基　　金：国家自然科学基金仪器专项(61027014);国家自然科学青年基金(61203184)

摘　　要：提出了一种从单幅干涉图中直接恢复相位的区间反转方法。分析余弦函数正负号歧义问题,导出反余弦相位和相位2π模之间的关系。由于在反余弦的(π,2π)区间需要对相位反转,将反转区间的确定问题转换为三段式折线拟合问题。利用遗传算法求解了折线的最小均方拟合,且使用最小二乘法估计了干涉图的载频,从而获得最佳相位估计。最后,分别对一维和二维合成条纹图进行测试,与传统的傅里叶变换方法和条纹分析方法比较,证实了提出方法的有效性和易用性。An interval inversion method was proposed to retrieve phase information directly from single interferogram. Due to the sign ambiguity of inverse cosine, an inversion was needed in the phase interval of （π,2π）. This interval estimation was translated to a problem of fold-line fitting that can be solved by a genetic algorithm. Further, the least square was employed to find an optimal linear carrier frequency for the final phase distribution. The method was applied to one-dimensional and two-dimensional numerical examples. Simulation results, compared with the methods of traditional Fourier transform and fringe analysis, demonstrate the effectiveness and the ease of use.

关 键 词：干涉 相位恢复 条纹分析 区间反转方法 

分 类 号：O438.1[机械工程—光学工程]