Mass thickness measurements for dual-component samples utilizing equivalent energy of X-rays  

作　　者：陈敏聪 田丽鸿 

机构地区：[1]Department of Computer and Technology,Nanjing Institute of Technology

出　　处：《Nuclear Science and Techniques》2014年第4期16-20,共5页核技术（英文）

基　　金：Supported by Nanjing Institute of Technology(No.121107090001)

摘　　要：In this paper,equivalent energy method is introduced for measuring mass thickness of dual-component samples using dual-energy X-rays.Approximately,the method adopts equivalent mass attenuation coefficients of the two components in mass thickness measurements for dual-component samples,in a certain range of thicknesses.Feasibility of the method is proven by numerical calculations and Monte Carlo simulations(EGSnrc package).The results of absorption experiments using an X-ray machine at tube voltages of 30 and 45 kV,the relative errors are less than 5%between the nominal and detected values.Also,optical low energy is discussed at given high voltages.In this paper,equivalent energy method is introduced for measuring mass thickness of dual-component samples using dual-energy X-rays.Approximately,the method adopts equivalent mass attenuation coefficients of the two components in mass thickness measurements for dual-component samples,in a certain range of thicknesses.Feasibility of the method is proven by numerical calculations and Monte Carlo simulations（EGSnrc package）.The results of absorption experiments using an X-ray machine at tube voltages of 30 and 45 kV,the relative errors are less than 5%between the nominal and detected values.Also,optical low energy is discussed at given high voltages.

关 键 词：双能X射线 厚度测量 质量厚度 能量等效 双组分 样品 质量衰减系数 能量方法 

分 类 号：O434.1[机械工程—光学工程]