尺寸对铜纳米薄膜2p_(3/2)能级偏移的影响  

Size Dependence of the 2p_(3/2) Binding Energy of Cu Nano-film

作　　者：周兆锋[1] 杨叶子[1] 王艳[1] 博茂林 

机构地区：[1]湘潭大学低维材料及其应用技术教育部重点实验室,湖南湘潭411105

出　　处：《湘潭大学自然科学学报》2014年第3期16-22,共7页Natural Science Journal of Xiangtan University

基　　金：国家自然科学基金面上项目(11242005;11002121)

摘　　要：结合断键理论(BOLS)和X射线光电子能谱(XPS)分析尺寸对铜纳米薄膜2p3/2能级偏移的影响.通过研究实验测得的XPS谱数据发现铜块体2p3/2的结合能为932.70eV,相对于铜单原子2p3/2的结合能931.00eV偏移了1.70eV.能级产生正偏移主要因为尺寸引起了键收缩,从而引起局域应变、量子势阱以及哈密顿量微扰的变化,最后导致了能级正偏移.事实证明我们可以利用配位数和化学环境来分析XPS谱,并进一步确定有关局域键长、键能、束缚能密度以及原子结合能等定量信息.Many studies have found that nano material relative to the bulk with a series of novel properties.The 2p3/2 binding energy shift of Cu nano-film with different size has been analyzed on the framework of bond order-length-strength （BOLS） correlation in decomposition of the X-ray photoelectron spectrum （XPS）.Theoretical reproduction of the measured spectroscopic data derived that the Cu 2p3/2 shifts positively by 1.70 eV from the atomic value of 931.00 eV to the bulk value of 932.70 eV.It is clarified that the positive energy shifts originate from the size-induced bond contraction,and illustrates that the dominance of the broken-bond-induced local strain and quantum entrapment perturbs the Hamiltonian and finally causes the positive shift.Exercises exemplify the enhanced capabilities of XPS in determining quantitative information regarding the evolution of the local bond length,bond energy,binding energy density,and atomic cohesive energy,with the coordination number and chemical enviroment.

关 键 词：X射线光电子能谱 能级 铜纳米薄膜 

分 类 号：O641[理学—物理化学]