强光对超二代像增强器图像的干扰研究  

Research on Intense Light Disturbance to Super Gen Ⅱ+ LLL Image Intensifier

作　　者：王冰 赵威 柴国庆 胡启立 李晓龙 

机构地区：[1]中国洛阳电子装备试验中心,河南洛阳471003 [2]光电对抗测试评估技术重点实验室,河南洛阳471003

出　　处：《红外技术》2014年第10期844-848,共5页Infrared Technology

摘　　要：通过开展非相干强光对高性能超二代微光像增强器的饱和干扰实验,得到了非相干强光对高性能超二代微光像增强器的干扰现象,对其干扰图像、干扰过程和干扰后恢复情况进行了分析,研究了强光辐射对微光像增强器电子增益的影响,分析了干扰光辐射照度与干扰形成光斑尺寸之间的关系。In this paper, the saturated jamming against Super Gen II＋ Image Intensifier by incoherent light was studied by experiment and simulation. The jamming image, jamming process and recovery time were analyzed through its interference phenomenon. The influences of incoherent light intensity to electron gain and jamming spot size of the image intensifier were researched. The detailed analysis was done and some valuable conclusions were made.

关 键 词：微光夜视 像增强器 超二代 非相干光干扰 电子增益 干扰光斑尺寸 

分 类 号：TN223[电子电信—物理电子学]