Rietveld全谱拟合方法在二次镍渣微晶玻璃中的应用  

Rietveld Full Spectrum Fitting Technology in Secondary Nickel Slag Glass-ceramics

作　　者：高术杰[1] 倪文[1] 林海[1] 张福利[1] 张思奇[1] 吴辉[1] 

机构地区：[1]北京科技大学土木与环境工程学院,北京100083

出　　处：《硅酸盐通报》2014年第9期2365-2369,共5页Bulletin of the Chinese Ceramic Society

摘　　要：利用金川提铁后的二次镍渣经过调质,在一定的热处理制度下能够制备成性能优异、主晶相为普通辉石的矿渣微晶玻璃。通过场发射电子显微镜（FE-SEM）发现,二次镍渣微晶玻璃晶体大小为200-300 nm;透射电子显微镜（TEM）与X射线衍射（XRD）等手段进一步证明该晶体是由30-40 nm更微小的晶粒团聚而成的。通过XRD步进扫描能够精确的测定微晶玻璃的结晶度、点阵常数等参数。Secondary nickel slag glass-ceramics is prepared with desired microstructure and property and the main crystalline phase is augite when the raw material is regulated. Field-Emission Scanning Electron Microscope（ FE-SEM） shows that the crystal size of secondary nickel slag glass-ceramics is about 200-300 nm. Transmission Electron Microscopy（ TEM） and X-Ray Diffraction（ XRD） further indicate that the crystal is agglomerated by grains,of which the size is just 30-40 nm. The grain is generally considered the primary unit of the secondary nickel slag glass-ceramics. Moreover,the crystallinity,lattice constant and grain size of glass-ceramics are being obtained by step-scan XRD.

关 键 词：二次镍渣微晶玻璃 Rietveld全谱拟合 结晶度 点阵常数 晶粒尺寸 

分 类 号：TD98[矿业工程—选矿]