凸度仪电离室探测器响应时间的估算方法  

Method for Estimating Response Time of Ionization Chamber Detectors in Profile Gauge

作　　者：郝朋飞[1] 吴志芳[1] 王振涛[1] 

机构地区：[1]清华大学核能与新能源技术研究院核检测技术北京市重点实验室,北京100084

出　　处：《核电子学与探测技术》2014年第5期553-556,共4页Nuclear Electronics & Detection Technology

基　　金：北京市科技计划资助项目(Z080903027508);国家自然科学基金资助项目(11205095)

摘　　要：为了实现凸度仪对热轧板带材的在线凸度检测功能,研制能快速响应的高压充气电离室探测器是一项关键工作。通过可靠的方法估算电离室的响应时间可以为凸度仪电离室的研制提供指导,降低研发成本。论文提出一种基于范式方程修正的估算方法,估算出了凸度仪电离室的响应时间。分析结果表明,该方法能够有效地估算电离室的响应时间,对凸度仪电离室探测器的研制具有参考意义。In order to achieve online detection of the crown of hot-rolled steel strips,it＇s a critical job to develop high gas-pressurized ionization chamber detectors which can response rapidly.Estimating the response time of ionization chamber in profile gauge by reliable methods can direct its development and reduce the cost.This paper proposed a estimation method based on Van der Waals equation correction,by which the response time of ionization chamber in profile gauge was estimated.Analysis results indicated that this method can effectively estimate the response time of ionization chamber,which had reference significance to the development of ionization chamber detectors in profile gauge.

关 键 词：响应时间 范德瓦尔斯方程 高压充气电离室 凸度仪 

分 类 号：TL81[核科学技术—核技术及应用]