一种对失调和电容失配误差进行补偿的流水线ADC子级电路  

A Sub-Stage Circuit with Comparator Offset and Capacitor Mismatches Errors Compensating for High Speed Pipelined ADC

作　　者：戴强[1] 薛颜[1] 杨霄垒 周启才[1,2] 吴俊[1] 郭良权[1] 

机构地区：[1]中国电子科技集团第五十八研究所,江苏无锡214035 [2]江南大学物联网工程学院,江苏无锡214122

出　　处：《电子器件》2014年第5期812-815,共4页Chinese Journal of Electron Devices

摘　　要：设计一种用于高速高精度流水线ADC的流水线ADC子级电路,采用伪随机序列控制子ADC电路中比较器阵列的参考比较电压。比较器的高低位被随机分配,消除某个比较器的固有失调对子ADC量化的影响,温度计码的伪随机性可以消除MDAC电容的失配误差对余量输出的影响。电路采用0.18μm 1P5M 1.8 V CMOS工艺,运用于12 bit 250 Msample/s流水线ADC电路中,实际测得流水线ADC电路的SNR为69.92 dB,SFDR为81.17 dB。A sub-circuit for high-speed, high-resolution pipelined ADC is presented. Reference voltages in comparators array are controlled by pseudorandom sequences. MSBs and LSBs of comparators are assigned randomly, accordingly the effect of offset of some comparator on ADC quantization is eliminated. Pseudo-random thermometer code cancels the effect of the mismatches of MDAC capacitors on residue output. This circuit implemented in 0.18 μm 1PSM 1.8 V CMOS process is applied to a 12-bit 250 Msample/s pipelined ADC. Test results shows that the ADC has an SNR of 69.92dB and an SFDR of 81.17 dB

关 键 词：流水线模数转换器 伪随机序列 失调误差 电容失配误差 

分 类 号：TN405[电子电信—微电子学与固体电子学]