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作 者:刘伟[1] 王泽忠[1] 刘译聪[1] 解荣越 傅海军[2] 岳思橙
机构地区:[1]华北电力大学高压与电磁兼容北京市重点实验室,北京102206 [2]北京电子工程总体研究所,北京100854
出 处:《科学技术与工程》2014年第32期124-128,共5页Science Technology and Engineering
摘 要:线缆耦合是HEMP对电子设备造成毁伤破坏效应的主要途径之一。针对影响网线中电压、电流的几个关键因素,如辐照场强等级、网线长度、放置方式、屏蔽与否等,从实验的角度探究网线的HEMP耦合规律。得到了网线芯线上耦合电压电流与环境场、网线长度之间的关系;分析了不同放置方式下芯电压、芯电流的之间的差异;测试了屏蔽网线的屏蔽效能,得到了皮电流与辐照场之间的关系。所得到的结论对于实验研究及防护设计都有参考意义。The interference of HEMP to electronic devices were mostly occurred through the coupling of electromagnetic field on the wires in practice. The aim of this paper is to present and discuss the contribution of different electromagnetic field component to the induced voltage and current from an experimental point of view, such as irradiation intensity, length, position, shielding effectiveness. The relations of coupling core voltage and core current with irradiation intensity were obtained from the point of law. The difference of core voltage and core current withcable position was analyzed. The shielding effectiveness of STP was tested, and the relation of skin current with irradiation field was obtained simultaneously. The obtained conclusion has reference significance for experimental research and protection of electronic systems where category 5e cable was used as transmission medium.
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