基于AETG算法的两两组合测试用例生成方法  

Method of generating pair-cover test cases based on AETG algorithm

作　　者：梁凡[1] 宋晓秋[1] 

机构地区：[1]中国航天科工集团第二研究院706所,北京100039

出　　处：《计算机工程与设计》2014年第11期3850-3854,共5页Computer Engineering and Design

摘　　要：对两两组合测试用例生成算法进行研究,在AETG算法的基础上进行改进,主要改进了AETG算法的参数排序过程。计算每个参数当前在未覆盖配对集中出现的次数,综合考虑其整体出现的次数以及单个取值出现的次数决定待扩展的参数序列。实验结果表明,该方法在缩短时间开销的基础上进一步减少了待测系统用例集的规模,当参数取值逐渐增加时,其优势更加明显。An algorithm based on the AETG algorithm was put forward after studying algorithms of deriving pair-wise test cases. The AETG algorithm was improved, majorly in the process of sorting parameters. The number of every parameter in the uneoverd case （UC） was calculated first, then the number of every paie-wise and the number of each parameter were considered to decide how to extend the sequence. The results of experiments show that the new method reduces both the test suite and the time, moreover when the number of parameters increases, the improved algorithm can display its superiority obviously.

关 键 词：两两组合 成对覆盖 AETG算法 AETG_I算法 参数排序 

分 类 号：TP311.56[自动化与计算机技术—计算机软件与理论]