La_(0.75)Ca_(0.25)MnO_3多晶陶瓷与外延薄膜的结构和电学性能研究  

Structure and Electrical Properties of La_(0.75)Ca_(0.25)MnO_3 Polycrystalline Ceramic and Thin Films

作　　者：高翔[1] 马吉[1] 张辉[1] Mya Theingi 杨盛安 陈清明[1] 

机构地区：[1]昆明理工大学,云南昆明650009 [2]仰光大学,缅甸仰光11181

出　　处：《稀有金属材料与工程》2014年第10期2415-2418,共4页Rare Metal Materials and Engineering

基　　金：国家自然科学基金(50902062);昆明理工大学分析测试基金(2011001)

摘　　要：采用溶胶-凝胶法制备了La0.75Ca0.25MnO3多晶靶材,并用紫外脉冲激光沉积法(PLD)在LaAlO3(100)单晶衬底上制备了La0.75Ca0.25MnO3外延薄膜。采用XRD测试了薄膜的晶体结构和生长取向,测试了薄膜(200)衍射峰摇摆曲线并分析了薄膜的结晶质量。利用原子力显微镜(AFM)表征了薄膜表面形貌,并利用四探针法测试了薄膜的电阻-温度(R-T)曲线。实验结果显示薄膜结晶质量较好,并沿c轴择优生长,且生长方式为层状生长。薄膜的绝缘体-金属转变温度(TIM)达到270 K以上,电阻温度系数(TCR)高达10%。La0.75Ca0.25MnO3（LCMO） polycrystalline ceramic was prepared by a sol-gel method,and the thin film was prepared on LaAlO3（100） single crystal substrates by pulsed laser deposition（PLD）.The structure and growth properties of the film were investigated by X-ray diffraction（XRD）.Crystalline quality of LCMO films was investigated by θ-scan rocking curves.The surface morphology of the film was studied by atom force microscopy（AFM） and the resistance-temperature（R-T） curves were measured using a conventional four-probe method.The experimental results show that the film is grown along c-axes and presents good crystalline quality.Large temperature coefficient of resistance of 10% at around 270 K is obtained.

关 键 词：La0.75Ca0.25MnO3 多晶 薄膜 脉冲激光沉积 电阻温度系数 

分 类 号：O484.42[理学—固体物理]