超高速多通道瞬态测试系统软硬件设计技术研究  

Design Technique Research on Ultra High Speed Multi-Channel Transient Testing System

作　　者：张荣[1] 陈颖[1] 黄海莹[1] 王松[1] 

机构地区：[1]中国工程物理研究院总体工程研究所,四川绵阳621900

出　　处：《计算机测量与控制》2014年第11期3500-3503,共4页Computer Measurement &Control

基　　金：中物院总体所专项基金(PXI-64)

摘　　要：介绍采样频率为2~10 MHz的64通道超高速同步瞬态测试系统的设计技术,主要包括超高速瞬态测试系统的两类硬件架构设计及其软件架构设计;详细讲述基于PXI Express总线传输和高速RAID阵列数据持续流盘存储与基于大容量板载数据缓存和总线下载传输的测试系统硬件架构,并应用生产者/消费者结构与有限状态机结合的软件架构进行高性能测试系统软件设计;针对数十GByte海量测试数据的存储、回调编程以及多通道波形显示等系统软件设计关键技术问题提出解决方案;基于上述技术方案,设计了256 MB/s流盘速度连续采集时间达5min以上的同步流盘测试系统以及10MHz/Ch持续时间6.4s的64通道超高速瞬态测试,满足瞬态测试的各种应用。The design technique for 64 channels ultra high speed synchronous transient testing system with data sampling frequency from2 MHz to 10 MHz is introduced.It includes two kind of hardware architecture and software architecture of ultra high speed transient testing system.For hardware architecture,the mode based on PXI express bus data transmission and RAID array stream disk data saving and the mode based on large capacity on-board cache data saving and bus downloading transmission are introduced in detail.For high performance system software design,the design technique with application of producer/consumer architecture and finite state machine is described.And it provides solutions for some system software design key problems of dozens of GB mass data saving and recalling and multi-channel signals displaying.Based on this technical scheme,64 channels synchronous continuous test system that stream disk speed of 256MB/s and test time up to five minutes and ultra high speed transient test system that sample frequency of 10MHz/Ch and test time up to 6.4sare designed,they can meet variety of application of transient test.

关 键 词：超高速瞬态测试系统 PXI EXPRESS总线 RAID阵列流盘 状态机 

分 类 号：TP751[自动化与计算机技术—检测技术与自动化装置]