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作 者:Shiromani Balmukund Rahi Bahniman Ghosh Pranav Asthana
机构地区:[1]Department of Electrical Engineering,Indian Institute of Technology Kanpur [2]Microelectronics Research Center,10100,Burnet Road,Bldg.160,University of Texas at Austin
出 处:《Journal of Semiconductors》2014年第11期59-63,共5页半导体学报(英文版)
摘 要:We propose a heterostructure junctionless tunnel field effect transistor (HJL-TFET) using AIGaAs/Si. In the proposed HJL-TFET, low band gap silicon is used in the source side and higher band gap AlGaAs in the drain side. The whole AlGaAs/Si region is heavily doped n-type. The proposed HJL-TFET uses two isolated gates (named gate, gatel ) with two different work functions (gate = 4.2 eV, gatel = 5.2 eV respectively). The 2-D nature of HJL-TFET current flow is studied. The proposed structure is simulated in Silvaco with different gate dielectric materials. This structure exhibits a high on current in the range of 1.4 × 10^-6 A/μm, the off current remains as low as 9.1 × 10^-14 A/μm. So /ON/OFF ratio of 10^8 is achieved. Point subthreshold swing has also been reduced to a value of 41 mV/decade for TiO2 gate material.We propose a heterostructure junctionless tunnel field effect transistor (HJL-TFET) using AIGaAs/Si. In the proposed HJL-TFET, low band gap silicon is used in the source side and higher band gap AlGaAs in the drain side. The whole AlGaAs/Si region is heavily doped n-type. The proposed HJL-TFET uses two isolated gates (named gate, gatel ) with two different work functions (gate = 4.2 eV, gatel = 5.2 eV respectively). The 2-D nature of HJL-TFET current flow is studied. The proposed structure is simulated in Silvaco with different gate dielectric materials. This structure exhibits a high on current in the range of 1.4 × 10^-6 A/μm, the off current remains as low as 9.1 × 10^-14 A/μm. So /ON/OFF ratio of 10^8 is achieved. Point subthreshold swing has also been reduced to a value of 41 mV/decade for TiO2 gate material.
关 键 词:band-to-band tunneling (BTBT) TFET heterostructure junctionless tunnel field effect transistor (HJL-TFET) ION/ION/IOFF ratio subthreshold slope VLSI
分 类 号:TN386[电子电信—物理电子学]
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