SEM与TEM相结合的原位电致振动方法  

Developed in-situ electric-field-induced resonance method combining SEM and TEM

作　　者：戴升[1] 赵炯[1] 莫日根[1] 朱静[1] 

机构地区：[1]北京电子显微镜中心,先进材料教育部重点实验室,清华大学材料学院,北京100084

出　　处：《电子显微学报》2014年第5期383-386,共4页Journal of Chinese Electron Microscopy Society

基　　金：国家自然科学基金资助项目(No.11374174;No.51390471);科技部973重大项目(No.2009CB623701)

摘　　要：针对复杂截面与显微结构的一维纳米材料,本文改进了本研究组现有的电致振动方法,可用扫描电镜和原位电致振动装置激发纳米线的共振行为,并用透射电镜观察同根纳米线显微结构和几何信息。改进的实验方法结合了扫描电镜与透射电镜的各自优点,实现了显微结构和性能的协同测量,可精确获得纳米线的杨氏模量。The existing in-situ SEM electric-field-induced resonance method was developed for the investigation of the mechanical properties of one dimensional nanomaterials with complex cross sections and structures. The developed method makes it possible to excite the resonant behavior of a nanowire inside the SEM and obtain the structure information of the same sample inside the TEM. The microstructure and the mechanical properties can be acquired simultaneously through this method and the accurate Young＇ s modulus of nanowires is able to be measured.

关 键 词：原位电子显微学 电致振动 一维纳米材料 力学性能 

分 类 号：TB383.1[一般工业技术—材料科学与工程]