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机构地区:[1]Department of Modern Physics, University of Science and Technology of China, Hefei 230026 [2]Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031
出 处:《Chinese Physics Letters》2014年第12期79-81,共3页中国物理快报(英文版)
摘 要:The runaway electron phenomenon caused by dis- ruptions is one of the challenging conditions on the ITER Tokamak, which may destroy the vacuum ves- sel. To avoid runaway electrons hitting the fist wall, there must be some monitor systems which can pro- vide position information of the runaway electron beam. Hard x-ray camera is the most conventional di- agnostic system to monitor the runaway electrons. While there is no hard x-ray camera working for the entire ITER operation phase even for D-D phase of ITER, there must be some systems playing the role of observation of the runaway electrons. In this case, with some international experiences from other Toka- mak devices, the soft x-ray camera can share the role of runaway electron observation. On JET and some other Tokamak devices, the runaway electron current generated by disruption has been observed by the soft x-ray camera system.The runaway electron phenomenon caused by dis- ruptions is one of the challenging conditions on the ITER Tokamak, which may destroy the vacuum ves- sel. To avoid runaway electrons hitting the fist wall, there must be some monitor systems which can pro- vide position information of the runaway electron beam. Hard x-ray camera is the most conventional di- agnostic system to monitor the runaway electrons. While there is no hard x-ray camera working for the entire ITER operation phase even for D-D phase of ITER, there must be some systems playing the role of observation of the runaway electrons. In this case, with some international experiences from other Toka- mak devices, the soft x-ray camera can share the role of runaway electron observation. On JET and some other Tokamak devices, the runaway electron current generated by disruption has been observed by the soft x-ray camera system.
分 类 号:TL631.24[核科学技术—核技术及应用] O484.5[理学—固体物理]
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