斜测电离图F2层描迹的自动判读  

Automatic scaling of F2 layer trace from oblique ionogram

作　　者：胡耀垓[1] 宋欢[1] 赵正予[1] 姜春华[1] 

机构地区：[1]武汉大学电子信息学院,湖北武汉430072

出　　处：《华中科技大学学报（自然科学版）》2014年第9期49-53,87,共6页Journal of Huazhong University of Science and Technology(Natural Science Edition)

基　　金：国家自然科学基金资助项目(41327002;41375007);湖北省自然科学基金青年杰出人才项目(2011CDA099)

摘　　要：将数字图像处理中的形态学算子和反演技术相结合,发展了一种新的斜测电离图F2层描迹自动判读方法.该方法从电离图预处理、电离图描迹提取和参数提取三大模块出发,实现了斜测电离图F2层描迹的自动判读,并用实际探测数据进行了验证及统计分析.结果显示:该方法适用于不同高角波状态的斜测电离图,能够快速、准确地拟合F2层寻常波描迹且不受毛刺的影响,并且提取的F2层最大可用频率和最小群路径的可接受率分别为95.1%和92.7%,表明该方法具有较好的可靠性、通用性,能有效应用于电离层实时斜测研究领域.A new method was proposed to automatically scale F2 layer trace from oblique ionogram based on mathematical morphology and inversion technique.The automatically scale F2 layer trace was realized from three modules,which were pre-process ionogram module,trace extraction module and parameter extraction module,then the detecting data were used to verify and statistical analysis the method.Results show that the method is suitable for oblique ionogram with different high angle waves,and it can fast and precisely fit ordinary wave of F2 layer without the influence of burrs,and the acceptance ratio of the maximum used frequency and virtual height of F2 layer are 95.1% and92.7%,which indicate that the method has good reliability and versatility,and can be effectively applied to real-time ionospheric oblique sounding research.

关 键 词：电离图 自动判读 描迹提取 斜测 形态学算子 反演 

分 类 号：P352[天文地球—空间物理学]