曲线图在纱条疵病分析中的应用  

Application of Curve Graph in Sliver Defects Analysis

作　　者：王俊英[1] 柳见亮 

机构地区：[1]山东科技职业学院,山东潍坊261053

出　　处：《棉纺织技术》2014年第12期29-32,共4页Cotton Textile Technology

摘　　要：探讨曲线图在纱条疵病分析中的作用。以诸多实例分析说明了电子条干均匀度测试中曲线图的特征以及运用曲线图进行疵点分析的方法。分析表明,与波谱图相比,曲线图能够直观反映纱条粗细变化情况,显示纱条长片段不匀,发现一些波谱图不能反映出的问题,能够更加准确地分析不匀波长,有时比波谱图分析更加简单,并能够准确地显示纱条中偶发性疵点的形态。认为,曲线图在纱条疵点分析中具有独特的优势;充分利用曲线图信息,可更好地进行纱条疵病分析工作,促进成纱条干质量的改进。Effect of curve graph in sliver defects analysis was discussed.Property of electronic evenness testing curve graph and use curve graph conducted defect analysis were analyzed by example.The analysis result indicates that compared with wave spectrogram,thickness and thickness changes can be visually reflected on the curve graph,yarn uneven length fragment can be displayed,some problem that not reflect on wave spectrogram can be fund,uneven wavelength can be analyzed more accurately,sometimes easier than wave spectrogram analysis,the sporadic form of the yarn defects can be displayed accurately.It is considered that unique features and advantages of curve graphs in sliver defect analysis are obviously.Sliver defects analysis work can be better and quality of yarn evenness can be promoted by using graph information.

关 键 词：曲线图 波谱图 长片段不匀 波长计算 疵点形态 

分 类 号：TS101.97[轻工技术与工程—纺织工程]