Wiener过程的金属化膜脉冲电容器步降应力退化建模  

Step-down-stress Degradation Modeling of Metalized Film Pulse Capacitors Based on Wiener Process

作　　者：李伟[1] 梁玉英[1] 程欣[2] 潘刚[1] 张国龙[1] 

机构地区：[1]军械工程学院,石家庄050003 [2]北方自动控制技术研究所,太原030006

出　　处：《火力与指挥控制》2014年第11期36-39,共4页Fire Control & Command Control

基　　金：国家自然科学基金(61271153);河北省重点基础研究基金资助项目(10963529D)

摘　　要：由于强激光装置中金属化膜脉冲电容器高可靠长寿命的特点,导致退化试验的时间长效率低,传统的退化试验统计分析方法复杂,对先验信息依赖性大,针对这些问题提出了基于Wiener过程的金属化膜脉冲电容器步降应力加速退化建模和参数估计的方法。首先,用Wiener过程刻画电容器的退化过程,然后结合随机过程的特性采用MCMC方法进行参数估计,大大简化了统计分析过程。最后通过对电容器的仿真实验,将步降应力下的评估结果与恒定应力、步进应力的情况相对比,说明了步降应力对改善退化试验的试验效率的有效性。The high reliability and long life characteristics of metallized film capacitors in laser device results in long degradation test time and low efficiency. Traditional degradation test depend on priori information and statistical analysis method is complex. In view of those problems,an evaluation method of step-down stress accelerated degradation modeling based on Wiener process is proposed. First,the degradation path is portrayed by a Wiener process. Then using the Wiener process characteristics and MCMC method in order to estimate parameters,this method greatly simplifies the procedure of Statistical Analysis. Finally,the simulation of metallized film capacitors is provided,the assessment of step-down stress is comprised with constant stress and step-up stress,the validity of improving efficiency is confirmed.

关 键 词：加速退化建模 WIENER过程 步降应力 金属化膜脉冲电容器 

分 类 号：TB114.3[理学—概率论与数理统计]