加速极限试验方法综述  

Overview of HALT/HASS Test Methods

作　　者：王文岳[1] 

机构地区：[1]工业和信息化部电子第五研究所华东分所,江苏苏州215011

出　　处：《电子产品可靠性与环境试验》2014年第6期57-61,共5页Electronic Product Reliability and Environmental Testing

摘　　要：介绍了高加速极限试验(HALT)与传统的可靠性试验的差异性,以及HALT和高加速应力筛选(HASS)技术及其应用;并对HALT/HASS技术的实施方案,HALT/HASS试验中应注意的问题,以及如何正确地看待HALT/HASS技术在产品研发与生产中的作用等内容进行了综述。A comparison between traditional reliability test and highly accelerated Limit test（ HALT/HASS） is presented. The specific technologies and applications of Highly Accelerated Limit Test（HALT） and Highly Accelerated Stress Screening（HASS） are introduced. The implementation scheme of HALT/HASS techniques and the issues that should be considered in the application are summarized. How to consider the role of HALT/HASS techniques in the product RD and manufacturing and their appropriate application are discussed in the end.

关 键 词：高加速寿命试验 高加速应力筛选 可靠性试验 

分 类 号：TB114.3[理学—概率论与数理统计]