一种新型数字芯片测试仪的设计与实现  

Design and Realization of a New Digital Chip Tester

作　　者：李天义[1,2] 耿跃华[3] 富坤[1] 张梅芳[1] 

机构地区：[1]河北工业大学计算机科学与软件学院 [2]中国人民解放军93642部队 [3]河北工业大学电气与自动化学院

出　　处：《自动化仪表》2014年第11期60-63,67,共5页Process Automation Instrumentation

基　　金：国家自然科学基金青年基金资助项目(编号:31100711);河北省高等学校科学技术研究青年基金资助项目(编号:20111122)

摘　　要：针对传统数字芯片测试设备检测芯片固定、PC机软件不可扩展、测试电路复杂等问题,设计了一种新型数字芯片测试仪。仪器设计为上位机和下位机两部分,并着重突出了上位机的作用。对组成上位机的编译模块、数据管理模块、SQLite数据库、测试模块和串口设置模块进行了研究,同时对以PL2303芯片为主的串口通信模块和以STC89C52为控制芯片的下位机电路进行了设计。系统能够准确地检测组合逻辑芯片、定位故障点,并能动态生成测试集、扩展可测组合逻辑芯片。Aiming at the problems of traditional digital chip test equipment, such as the tested chips are fixed, PC software cannot be extended, and the testing circuit is complex, etc. , a new digital chip tester has been designed. The design consists of two parts： the host computer, and the lower computer, and the role of the software in host computer is highlighted emphatically. The compositions of host computer, including compilation module, data management module, SQLite database, test module and serial port setup module are researched, in addition, the serial communication module based on PL2303 as the core, and the circuit with STC89C52 as control chip in lower computer are designed. The system can precisely detect combinational logic chip, positioning the fault point, and dynamically create test set, expand measurable combinational logic chip.

关 键 词：编译功能 SQLITE数据库 芯片测试 测试集 结果集 故障检测 

分 类 号：TP36[自动化与计算机技术—计算机系统结构]