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机构地区:[1]厦门理工学院光电与通信工程学院,福建厦门361024
出 处:《厦门理工学院学报》2014年第5期51-55,共5页Journal of Xiamen University of Technology
基 金:国家自然科学基金项目(61202013);厦门理工学院科研启动基金项目(90010628)
摘 要:两边类型低密度奇偶校验码(two-edge type low density parity check,TET-LDPC码)是一种高效的信道纠错码,其性能受到删余变量节点度(punctured variable node degree,PVN度)的影响.为了分析PVN度对TET-LDPC码纠错性能的影响,基于外信息转移图(extrinsic information transfer,EXIT图)估算了TET-LDPC码在不同PVN度情况下的门限值,利用门限值的好坏来分析纠错性能的优劣,进而通过选取门限值好的PVN度优化TET-LDPC码.仿真结果显示,经过EXIT图优化的TET-LDPC码具有更好的纠错性能.利用EXIT图优化分析TET-LDPC码的方法,比现有的仿真试值法更加简捷、直观.Two-edge type LDPC ( TET-LDPC) codes are a class of good channel error-correction codes. Their performances are significantly impacted by punctured variable node ( PVN) degrees. In order to analyze the impact of PVN degrees on TET-LDPC codes, an optimization and analysis method was proposed to estimate the thresholds of TET-LDPC codes with different PVN degrees based on extrinsic information transfer ( EXIT) charts. Since good thresholds indicated good performances, the optimization of TET-LDPC codes was accomplished by choosing PVN degrees with good thresholds. Simulation results showed that the TET-LDPC codes optimized by the proposed method outperformed other TET-LDPC codes. The proposed EXIT-chart-based optimization and analysis method is easier and more visual than the exiting performance-simulation method.
关 键 词:TET-LDPC码 EXIT图 门限值 优化分析
分 类 号:TN929.53[电子电信—通信与信息系统]
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