Theoretical analysis of BLM system for HLS Ⅱ  

作　　者：陈裕凯 李裕熊 李为民 何丽娟 

机构地区：[1]National Synchrotron Radiation Laboratory,University of Science and Technology of China

出　　处：《Chinese Physics C》2015年第1期83-86,共4页中国物理C（英文版）

基　　金：Supported by National Natural Science Foundation of China(11175180,11175182)

摘　　要：Hefei Light Source （HLS） is being upgraded to HLS Ⅱ. Its emittance will be much lower than before, therefore the Touschek scattering will increase significantly and become the dominant factor of beam loss. So it is necessary to build a new beam loss monitoring （BLM） system that, in contrast to the old one, is able to obtain the quantity and position information of lost electrons. This information is useful in the commissioning, troubleshooting, and beam lifetime studying for HLS Ⅱ. This paper analyzes the distribution features of different kinds of lost electrons, introduces the operation parameters of the new machine and discusses how to choose proper monitoring positions. Based on these comprehensive analyses, a new BLM system for HLS Ⅱ is proposed.Hefei Light Source （HLS） is being upgraded to HLS Ⅱ. Its emittance will be much lower than before, therefore the Touschek scattering will increase significantly and become the dominant factor of beam loss. So it is necessary to build a new beam loss monitoring （BLM） system that, in contrast to the old one, is able to obtain the quantity and position information of lost electrons. This information is useful in the commissioning, troubleshooting, and beam lifetime studying for HLS Ⅱ. This paper analyzes the distribution features of different kinds of lost electrons, introduces the operation parameters of the new machine and discusses how to choose proper monitoring positions. Based on these comprehensive analyses, a new BLM system for HLS Ⅱ is proposed.

关 键 词：storage ring beam loss beam lifetime Touschek lifetime 

分 类 号：O436[机械工程—光学工程]