改进型双滤光片切换器(IR-CUT)测试机的设计  

Design of an Improved Tester of Infrared-CUT

作　　者：文海明[1] 余毅[1] 

机构地区：[1]江西工业工程职业技术学院,江西萍乡337055

出　　处：《廊坊师范学院学报（自然科学版）》2014年第6期50-52,共3页Journal of Langfang Normal University(Natural Science Edition)

摘　　要：采用Microchip公司的16位高性能控制芯片,构建了改进型IR-CUT测试机,能实现多通道多次连续测试,测试时间间隔可调,支持三种供电电压模式选择。经过实践验证,测试机台运行稳定,测试过程安全可靠,方便常规作业。The design described that we construct and improve the IR- CUT test machine by the high performance control chip. The machine is with the variable test time, and support three voltage modes. Through practical verification, the test machine could run steadily with the Safe and reliable test process.

关 键 词：IR-CUT 测试次数 测试时间间隔 模式选择 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]