基于相位信息辅助的散斑匹配三维测量方法  

Three-Dimensional shape measurement method based on speckle pattern with prior phase information

作　　者：戴鲜强 盖绍彦[1,2,3] 达飞鹏[1,2] 

机构地区：[1]东南大学自动化学院,南京210096 [2]复杂工程系统测量与控制教育部重点实验室,南京210096 [3]华中科技大学数字制造装备与技术国家重点实验室,武汉430074

出　　处：《仪器仪表学报》2014年第12期2792-2800,共9页Chinese Journal of Scientific Instrument

基　　金：国家自然科学基金(61405034;51175081;51475092);教育部博士点基金(20130092110027);江苏省文物科研课题;华中科技大学制造装备与技术国家重点实验室项目(DMETKF2012002)资助

摘　　要：本文提出了一种基于单幅散斑条纹和相移光栅条纹投影的物体三维轮廓测量系统。该系统在物体表面投射散斑图案获得初始的匹配点对后,再通过投射相移光栅条纹解得的主值相位场对获得的点对进行精确匹配。所提出的方法通过投射散斑图案确定不同视角下对应像素点的所在位置,不需要采用解包裹算法得到全场完整的相位场,使得每一像素点的精确匹配点可以直接在主值相位场中获得。实验证明所提出的方法可以获得高质量的三维形状测量结果,且相比于传统的投影光栅相位法在速度上有较大提升,增加了光栅投影三维测量的实用性。A three-dimensional shape measurement system based on the projection of one digital speckle pattern and phase-shifted fringe patterns is proposed. The preliminary corresponding point of each pixel can be obtained by the projection of a digital speckle pattern onto the surface of the project, and the correspondence refinement using wrapped phase map is performed, which is calculated by projecting phase-shifted fringe patterns. Unlike the conventional methods, the proposed method can determine the location of the correspondence points in different views by the digital speckle pattern, and the phase unwrapping algorithm is not required to obtain the absolute phase, so each pixel can explore its corresponding point directly from the wrapped phase map. Experiments demonstrate that the proposed method can achieve high-quality three-dimensional measurement and shorten the time as compared with the traditional method. Therefore, the method enhances the practicability of the system.

关 键 词：测量 三维测量系统 数字散斑 相移法 立体匹配 

分 类 号：TP391[自动化与计算机技术—计算机应用技术] TH741[自动化与计算机技术—计算机科学与技术]