用迈克尔逊干涉仪测双光源等厚干涉及其波长差  

Observation of Double Light Source Equal Thickness Interference by Using a Michelson-interferometer

作　　者：王钢[1] 方奕忠[1] 

机构地区：[1]中山大学,广东广州510275

出　　处：《大学物理实验》2014年第6期37-40,共4页Physical Experiment of College

基　　金：中山大学实验教学改革项目(No.YJ201109)

摘　　要：利用迈克尔逊干涉仪,搭建了一个观察双光束等厚干涉条纹的实验装置,并利用该装置测量了绿色激光器与低压汞灯绿色光谱线的波长差,以及红色激光器与黄色稀土节能灯红色光谱线的波长差,实验值与光栅光谱仪的测量结果一致。该方法可推广为一种测量未知光谱线波长值的方法。A device has been assembled on a Michelson-interferometer for observing the fringes of two-beam equal thickness interference. Using this device,wave-length difference between a green laser and the green spectral line of a low pressure mercury lamp,and that between a red laser and the red spectral line of a rareearth energy-saving lamp have been measured. Experimental results consist with that measured by grating spectrometer. Therefore,this new method can be used to measure the wave length of an unknown spectral line.

关 键 词：迈克尔逊干涉仪 双光束干涉 衬比度 光程差 

分 类 号：O433.1[机械工程—光学工程]