Toward one nanometer X-ray focusing: a complex refractive lens design  

作　　者：陈直 谢红兰 邓彪 杜国浩 江怀东 肖体乔 

机构地区：[1]Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics,Chinese Academy of Sciences [2]University of Chinese Academy of Sciences [3]State Key Laboratory of Crystal Materials, Shandong University

出　　处：《Chinese Optics Letters》2014年第12期137-140,共4页中国光学快报（英文版）

基　　金：partially supported by the National 973 Program of China(No.2010CB834301);the National Natural Science Foundation of China(No.31100680);the Chinese Academy of Sciences Key Project of International Co-operation(No.GJHZ09058);the External Co-operation Research Project(No.GJHZ1303);the Joint Funds of the National Natural Science Foundation of China(No.U1232205)

摘　　要：We report a design for one nanometer X-ray focusing by a complex refractive lens, which is capable of focusing 20 keV X-rays down to a lateral size of 0.92 nm （full-width at half-maximum （FWHM）） and an axial size of 98 nm （FWHM） with intensity gain of 49050. This complex refractive lens is comprised of a series of kinoform lenses, whose aperture is gradually matched to the converging trace of the X-ray beam so as to increase the numerical aperture （NA）. The theoretical principle of the proposed complex refractive lens is presented. The NAs of these lenses are calculated. The numerical simulation results demonstrate that the proposed design can focus the X-ray beam into sub-nanometer while remaining high gain.We report a design for one nanometer X-ray focusing by a complex refractive lens, which is capable of focusing 20 keV X-rays down to a lateral size of 0.92 nm （full-width at half-maximum （FWHM）） and an axial size of 98 nm （FWHM） with intensity gain of 49050. This complex refractive lens is comprised of a series of kinoform lenses, whose aperture is gradually matched to the converging trace of the X-ray beam so as to increase the numerical aperture （NA）. The theoretical principle of the proposed complex refractive lens is presented. The NAs of these lenses are calculated. The numerical simulation results demonstrate that the proposed design can focus the X-ray beam into sub-nanometer while remaining high gain.

关 键 词：DESIGN FOCUSING Full width at half maximum 

分 类 号：TH74[机械工程—光学工程]