利用HPGe γ谱仪快速测量^(226)Ra  

Rapid Measurement of ^(226)Ra Using HPGe Gamma Spectrometer

作　　者：张轶名 於国兵 杜勤 闻德运 顾先宝 潘灵婧 

机构地区：[1]中国同辐股份有限公司,北京100045 [2]安徽省辐射环境监督站,安徽230022 [3]中国科学技术大学核科学技术学院,安徽230027

出　　处：《核电子学与探测技术》2014年第9期1132-1134,共3页Nuclear Electronics & Detection Technology

摘　　要：HPGeγ谱分析中,一般通过测量222Rn的子体来确定样品中226Ra的含量,这种方法需要对样品密封数周后测量,无法实现样品中226Ra含量的快速测量。文章分析了样品γ谱中186 ke V全能峰的计数来源,对使用186 ke V全能峰计算出的226Ra的含量结果进行修正,得到较好的实验结果,实现了用186 ke V全能峰快速测量样品中Ra的含量。In general , the content of 226 Ra in a sample is deduced from results of 222 Rn progeny in HPGeγspectral analysis .Because the sample should be sealed for several weeks before the measurement , we can not get the results quickly through this method .The paper analyzes the source of the counts of the full -en-ergy peak in 186 keV in the full-energy peak , and modifies the result of 226 Ra content calculated by using the full-energy peak in 186 keV.The study gets good experiment results and realizes the rapid measurement of Ra in samples using the full -energy peak in 186 keV.

关 键 词：HPGeγ 谱分析 ^226RA 快速测量 

分 类 号：TL81[核科学技术—核技术及应用]