高精度实时主动轴向防漂移系统研究  

A real-time axial activeanti-drift device with high-precision

作　　者：霍英东[1,2] 曹博[2] 于斌[2] 陈丹妮[2,3] 牛憨笨[2] 

机构地区：[1]中国科学院西安光学精密机械研究所,超快诊断技术中国科学院重点实验室,西安710119 [2]深圳大学光电工程学院,光电子器件与系统(教育部、广东省)重点实验室,深圳518060 [3]清华大学精密测试技术及仪器国家重点实验室,北京 100084

出　　处：《物理学报》2015年第2期409-414,共6页Acta Physica Sinica

基　　金：国家重点基础研究发展计划(批准号:2012CB825802,2015CB352005);国家自然科学基金(批准号:61335001,61235012,61178080,11004136,60878053);国家重大科学仪器设备开发专项(批准号:2012YQ15009203);深圳市科技计划(批准号:ZYC201105170233A,JCYJ20120613173049560)资助的课题~~

摘　　要：基于单分子定位的荧光纳米分辨显微成像中,系统漂移会使得单分子定位出现额外偏差,从而使重构图像的分辨率降低,造成图像模糊.因此,对系统漂移量的控制至关重要.近年来,防漂移的方法层出不穷.本文针对其中一种利用光学测量原理和引入负反馈的防漂移方法做了系统的研究,分析了其原理和实现过程,对整个系统进行了误差分析,通过实验标定了整个防漂移系统的精度.该系统可以主动实时地校正漂移量,实现了显微镜轴向9.93 nm的防漂移精度.与现有商用的显微镜自带的防漂移装置相比,防漂移精度提高了一个量级.In a fluorescent nano-resolution microscope based on single molecular localization, drift of focal plane will bring an additional deviation to the accuracy of single molecular localization. Consequently, this will reduce the final resolution of the reconstructed image and cause image degradation. Therefore, it is vital to control the system drift to a minimum level as much as possible. In recent years, the anti-drift ways emerged in endlessly. In this paper we made a systematic study aiming at the method in which optical measurement and negative feedback control are used. The basic principle and its implementation of the system are analyzed, and possible error is also evaluated. Finally, the precision of the system is tested experimentally. With this device, axial drift can be detected and corrected automatically in time, and the axial anti-drift accuracy as high as 9.93 nm can be achieved, which is one order higher than that of the existing commercial microscopies.

关 键 词：纳米分辨 四象限探测器 轴向防漂移 

分 类 号：TH742[机械工程—光学工程]