屏蔽效能与光电导率的关系  

Relation Between Electromagnetic Shielding Effectiveness and Photon Conductivity

作　　者：张青翠[1] 孙继伟[1] 吕德涛[1] 

机构地区：[1]中国电子科技集团公司第33研究所电磁防护材料与器件事业部山西·太原030006

出　　处：《电子材料与电子技术》2014年第4期1-4,共4页Electronic Material & Electronic Technology

摘　　要：]本文阐述了在半导体、绝缘体和金属中光电导率与频率的色散关系，及光电导率与材料吸收和反射的关系，从理论上阐述了光电导率与屏蔽效能之间的关系。这一理论的阐述对屏蔽材料的选材具有指导性。This paper focuses on the disporsion relation between photons conductivity and frequency in semiconductor, insulator and metal. Thus, we obtained the relation between photon conductivity and material reflectivity or absorbance. Consequently, the relation between the photon conductivity and electromagnetic shielding is clear. Via the relation, it is easy to select material with electromagnetic shielding.

关 键 词：光电导率 频率 反射 吸收 屏蔽效能 

分 类 号：TM153.5[电气工程—电工理论与新技术]