强^(63)Ni片状源β粒子发射率的测量方法  

Test Method for High β Particle Emission Rate of ^(63)Ni Source Plate

作　　者：张利峰[1] 马俊平[1] 张磊[1] 张海旭[1] 闫素娟[1] 姚历农[1] 罗志福[1] 

机构地区：[1]中国原子能科学研究院同位素研究所,北京102413

出　　处：《同位素》2015年第1期25-27,共3页Journal of Isotopes

摘　　要：用于63 Ni辐生伏特电池的片状63 Ni源β粒子发射率存在难于测量的问题,本文根据闪烁探测器的测量原理建立了闪烁电流法的相对测量方法。利用该测量方法对自制的63 Ni源的发射率进行了测量,对所测结果进行了分析,初步认为闪烁电流法是一种用于测量高发射率片状63 Ni源β粒子发射率的可行方法。For the problem of measurement difficulties of β particle emission rate of Ni- 63 source plate used for Ni-63 betavoltaic battery, a relative test method of scintillation current method was erected according to the measurement principle of scintillation detector. β particle emission rate of homemade Ni-63 source plate was tested by the method, and the test results were analysed and evaluated, it was initially thought that scintillation current method was a feasible way of testing β particle emission rate of Ni- 63 source plate with high β particle emission rate.

关 键 词：^63Ni辐生伏特电池 ^63Ni源 β粒子发射率 

分 类 号：TL84[核科学技术—核技术及应用]