超小口径元件光谱参数检测设备改进  

Improve on Extra Small Optics Spectral Parameter Testing Equipment

作　　者：马玉荣[1] 石振东[1] 原泉[1] 冯晓璇[1] 马可[1] 杨一[1] 任寰[1] 

机构地区：[1]中国工程物理研究院激光聚变研究中心,绵阳621900

出　　处：《科学技术与工程》2015年第3期216-219,共4页Science Technology and Engineering

摘　　要：为实现超小光学元件(直径小于φ15 mm)光谱参数的检测,在现有商用分光光度计的基础上,对设备进行了改进完善,通过在测试光路和参考光路增加衰减比相匹配的缩束小孔,成功实现了检测光束的缩束。实验结果表明:改进后的设备基线平直度不大于!0.001 A,标准元件检测结果与标定值偏差不超过0.05%。In order to measure the spectral parameter of extra small optics which diameter is less than fifteen millimeter,commercial spectrophotometer was improved.Measure beam was shrinked successfully by setting the pinholes with suited attenuation ratio on both measure and reference beam.The experimental results show that the equipment baseline straightness is no greater than ±0.001 A after improvement,the deviation between the standard optics test results and the calibration value is no more than 0.05%.

关 键 词：透射率 反射率 分光光度计 光学元件 小孔 衰减比 

分 类 号：TH744.12[机械工程—光学工程]