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作 者:CAO Hua Min HUO Zong Liang WANG Yu LI Ting LIU Jing JIN Lei JIANG Dan-Dan ZHANG Deng Jun LI Di LIU Ming
机构地区:[1]Institute of Microelectronics, Chinese Academy of Sciences [2]College of Communication Engineering, Chengdu University of Information Technology [3]Guangdong Berg Micro Co., Ltd.
出 处:《Science China(Technological Sciences)》2015年第2期357-361,共5页中国科学(技术科学英文版)
基 金:supported by the MOST(Grant Nos.2010CB934200 and 2011CBA00600);the National Natural Science Foundation of China(Grant Nos.61176073 and 61221004)
摘 要:This paper presents an embedded SRAM design for write buffer applications in flash memories.The write buffer is implemented with a newly proposed self-adaptive timing control circuit,an area-saving sense-latch circuit and 6 T SRAM cell units.A 2 kb SRAM macro with the area of 135μm×180μm is implemented in and applied to a 128 Mb NOR flash memory with the SMIC 65 nm NOR flash memory process.Both simulation and chip test results show that the SRAM write buffer is beneficial to high-density flash memory design.
关 键 词:write buffer embedded SRAM FLASH 65 nm technology 2 kb 128 Mb
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