利用半导体激光衍射条纹测丝径和缝宽  

Measuring Wire's Diameter and Width with Semiconductor Laser's Diffraction Strip

作　　者：许江勇[1] 吴浪[1] 林秋霞[1] 杨建义[1] 周波[1] 

机构地区：[1]兴义民族师范学院,贵州兴义562400

出　　处：《兴义民族师范学院学报》2014年第5期108-111,共4页Journal of Minzu Normal University of Xingyi

基　　金：贵州省高等学校教学内容和课程体系改革项目[黔教高发(2012)426号];贵州省大学生创新训练一般项目(201310666004);兴义民族师范学院本科教学质量与教学改革工程项目[兴师发(2014)21号]

摘　　要：根据惠更斯-菲涅耳原理,导出了衍射物尺寸与光波长、衍射距离、条纹级数和条纹偏距的参数方程,分析了半导体激光衍射条纹的光强分布规律,依此进行了实验验证。结果表明:可以利用半导体激光衍射条纹测量丝径和缝宽,测量值的准确度相当高,从而拓展了一种测量丝径和缝宽的新方法,为光学实验的创新教学提供了理论依据。The parameter equation of diffracting object＇ s size and wavelength, diffraction distance, stripe series and strip setover is inferred according to Huggens-Fresnel principle, then the intensity distribution laws of semiconductor laser＇s diffraction strips is accordingly analyzed, and then corresponding experiment is conducted for validation. The results show that the wire＇s diameter and width can be accurately measured with the help of semiconductor laser＇ s diffraction strip, thus it can be regarded as a new method to measure wire＇ s diameter and width and provide theoretical basis for innovative teaching of optical experiments.

关 键 词：半导体激光 衍射条纹 丝径 缝宽 

分 类 号：O436.1[机械工程—光学工程]