低温放大器极低噪声温度测试技术研究  

Research of the noise temperature measurements of cooled low- noise amplifiers

作　　者：王贤华[1] 张士刚[1] 吴志华[1] 王自力[1] 侯俊南 

机构地区：[1]中国电子科技集团公司第十六研究所,中国电子科技集团公司低温电子技术研发中心 [2]163778部队

出　　处：《低温与超导》2015年第2期88-92,共5页Cryogenics and Superconductivity

摘　　要：概述了低温低噪声放大器噪声温度两种测试的方法,一种是可变负载温度测试方法,另一种是低温衰减器测试方法。对可变负载温度测试方法和低温衰减器测试方法进行了误差分析。给出了各种方法测试实例,且与国外低温低噪声放大器噪声温度测试指标进行对比,误差很小。This article described two method to obtain noise temperature of cooled low - noise amplifier, i.e. the hot - cold load measurement method and cryogenic attenuator noise measurement method. Error analysis for two measurement methods was conducted. An example for the measurement methods was provided. A comparison of noise - temperature data with one from other literatures was done and error by two methods above was very small.

关 键 词：低温低噪声放大器 可变负载温度法 测试方法 

分 类 号：TN722.3[电子电信—电路与系统]