FPGA时延故障检测技术研究  

Research of Delay-Fault Testing Technology in FPGA

作　　者：杨士宁[1] 顾颖[1] 石雪梅 

机构地区：[1]中国航天科工二院二〇一所,北京100854

出　　处：《计算机与数字工程》2015年第1期75-79,共5页Computer & Digital Engineering

摘　　要：随着FPGA器件的应用越来越广泛,FPGA的测试和故障诊断技术得到了广泛重视和研究。FPGA的时延故障是FPGA内部故障中非常重要的一类故障类型,主要包含器件内部逻辑资源时延故障和连线资源时延故障。论文通过分析FPGA的内部结构和时延故障特性,研究FPGA内部逻辑资源时延和连线资源时延故障检测方法。利用Xilinx公司Virtex-Ⅱ系列FPGA完成时延故障检测方法验证,证明了FPGA时延故障检测的可实现性。With the fast application of FPGA devices,the FPGA device fault testing and fault diagnosis method for a more comprehensive study is of great significance.The delay-fault is an important type of FPGA interior faults.The FPGA delay-fault includes interior logic resources delay and interior routing resources delay.Therefore,the inter structure and delay-fault of FPGA are analyzed,and the fault testing method for interior logic resources delay and interior routing resources delay are researched.The test approach is successfully implemented using one Virtex-Ⅱ FPGA of Xilinx.The realization of Delay-Fault Testing technology in FPGAs is proved.

关 键 词：FPGA 时延故障 测试技术 

分 类 号：TN407[电子电信—微电子学与固体电子学]